Stereomicroscope
Leica DFC490, MZ16A
With image analysis system, increase 10-300x.
Light microscope with polarization function
Leica DFC320, DMLP
Increase 10-1000x.
Inverse microscope
Possibility to see samples from below, eg., cells in a Petri dish.
Scanning electron microscope
Tescan Mira/LMU
Increase 4x – 500 000x. It is possible to determine the homogeneity of the sample composition (result – image), it is possible to determine the chemical composition in a specific area (eg. 1×1 µm), to perform identification of point inclusions – determine the chemical elements present in the sample and their proportion. Pore dispersion and distribution can be assessed visually, measure pores, crystals, etc. object sizes. Can be a non-destructive analytical method, the sample can be returned intact. An electrically conductive coating sprayer and an inert gas atmosphere are also included. More about the results of SEM here.
Optical dilatometer (high temperature microscope)
EM201, HT163
Possibility to observe the changevof the sample countur by heating till 1400°C – to observe shrinkage, swelling, melting, etc., as well as to track changes in the angle and area of the contour corner.
Preparation of samples for microscopy
- Low speed saw with diamond disc. Thickness of sample 0-25 mm. Holders for different shapes of sample.
- Polishing pastes of various roughness.